Wavelet-based neural network and statistical approaches applied to automated visual inspection of LED chips
نویسندگان
چکیده
Hong-Dar Lin*, Gary C Lin, Chung-Yu Chung, and Wan-Ting Lin Department of Industrial Engineering and Management, Chaoyang University of Technology, 168 Jifong E. Rd., Wufong Township, Taichung County, 41349, Taiwan Department of Industrial and Manufacturing Engineering and Technology, Bradley University, 1501 West Bradley Avenue, Peoria, IL 61625, USA College of Business, University of Missouri-Columbia, 213 Cornell Hall, Columbia, MO 65211, USA
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